12:00 – 12:20

Key Challenges in Enabling AI and Specialty Segments via Metrology, Inspection and Lithography Technologies

Previous waves of growth experienced by the semiconductor ecosystem were dominated by the onset of the personal computer, followed by the arrival of internet, and then the smartphone – the next wave of growth is going to be largely dominated by the demand for AI enabled device technologies. Whether in Automotive, Industrial or Consumer applications, the demand for AI technologies cuts across multiple segments of the semiconductor industry from advanced node next generation CPU/GPUs to advanced high bandwidth memory, chiplet technologies drawn from a variety of mature and specialty node device technologies to finally, advanced packaging at both the wafer and panel levels. This presentation will introduce Onto Innovation and in discussing the many challenges faced in supporting waves of end market growth enabled by advanced technologies such as AI or enabling specialty technologies such as Power in Automotive and Green Energy, it will highlight the many unique and powerful process control technologies Onto is bringing to the semiconductor market.

Toshihito Tsuga photo

Toshihito Tsuga

Regional Account Business Unit

Onto Innovation