Gayn Erickson photo
EU PSES 2022 Speaker

Gayn Erickson

  • Aehr Test Systems
  • President & CEO
  • Biography

Joined the Company as President and Chief Executive Officer in January 2012. Prior to joining Aehr, Mr. Erickson served as Corporate Officer and Senior Vice President & General Manager of Verigy’s memory test business. Prior to that, Mr. Erickson was Vice President of Marketing and Sales for Agilent Technologies’ Semiconductor Memory Test products. He has over 34 years of executive and general management, operations, marketing, sales, and R&D program management experience dating back to the late 1980s, when he began his career in semiconductor test with Hewlett-Packard’s Automated Test Group. He received a B.S. in Electrical Engineering from Arizona State University.

  • Presentation

Evaluating Stabilization of SiC MOSFET Gate Threshold Voltage at Wafer Level

The transition from discrete Silicon Carbide (SiC) components to multiple SiC die modules or integrated power modules has driven the requirement for known good die (KGD) where the gate threshold voltage stability is critical to the module reliability driven by the prerequisite to have matching and stable gate voltage threshold die-to-die. This presentation will provide examples of gate threshold instabilities and failures along with the technologies and capabilities available that enable gate threshold stability and reliability at wafer level.

Aehr Test Systems logo
  • Company Profile

Aehr Test Systems

Aehr Test Systems (NASDAQ: AEHR), the leader in wafer level test & burn-in (WLTBI) for Silicon Carbide (SiC) and Gallium Nitride (GaN) ensuring product stability and reliability.

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