A 360 View of Semiconductor Test from AI and Security Perspective

ISES Docs:

This keynote will explore the impact of deep learning including large language models on the semiconductor test. We will highlight the opportunities these models present for real-time data processing and discovery of insights, with specific applications in computer vision and natural language processing. However, the use of these models also introduces new security risks, particularly regarding the use of cloud infrastructure for collection of data, training and inference. By examining past attacks on networks, we will discuss the potential for malicious actors to steal data or intellectual property from companies. Attendees will gain an understanding of the opportunities and challenges in AI and security for the coming years and the importance of considering security measures in the development and deployment of these advanced solutions.

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Michael Chang

VP & GM, Advantest Cloud Solutions


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