11:40 – 12:20

PANEL (Yield): AI & Smart Automation for Yield Breakthroughs

  • AI-driven predictive maintenance & defect detection
  • Next-gen process control for defect-free output
  • Balancing automation with human oversight

 

Moderator

Chun Sheng Tan

Executive Director

NMI Sdn Bhd

Panelist

Sim Cik Goh

Vice President, Fab Operations

Qualcomm Technologies Inc.

Panelist

Lip Wee Ho

Vice President of Advanced Technologies Singapore (ADTS)

Micron Technology, Inc.

Panelist

Patrick Hirt

VP, Business Development

AP&S International GmbH

Panelist

Chor Shu Cheng

Yield Engineering Director

Skyworks Solutions