15:45 – 15:55

Coping with complexity – a flexible test system for a wide range of digital sensors

As MEMS sensor technologies evolve and MEMS sensor applications increase in complexity to offer more and more functions also sensor interfaces have become a constantly changing target. To be able to cope with the already existing variety of sensor interface parameters as well as be ready for future advancements in sensor protocols and data rates IDM’s and test service providers need to make smart decisions towards proper test equipment. In this presentation a flexible and cost efficient solution for testing digital sensors will be presented.

Ingolf Leidert

Product Manager Device Testing

SPEKTRA GmbH Dresden