Benchmarking has long been a central practice in semiconductor manufacturing, yet many approaches rely on generalized metrics or incomplete comparisons that obscure the true levers of fab performance. As fabs navigate escalating technology complexity, rising capital intensity, and increasingly variable customer demands, a more rigorous and data-driven benchmarking framework is required.
This presentation will outline a structured methodology for benchmarking semiconductor fabs that emphasizes metrics most directly linked to operational excellence — including yield, cycle time, equipment effectiveness, and cost efficiency. Particular attention will be given to the interdependencies among these metrics, such as the coupling of yield and cycle time, and the influence on fab performance.
Key discussion points will include:
• Methodologies for designing benchmarking frameworks applicable across diverse fab sizes and technology portfolios.
• The importance of coupling and contextualizing KPIs to avoid misleading conclusions.
• Insights from fab case studies demonstrating how targeted benchmarking initiatives have revealed hidden inefficiencies and enabled measurable improvements.
• Practical pathways for translating benchmarking insights into sustainable competitive advantage.
By advancing from descriptive comparisons to analytically grounded benchmarking, fabs can move beyond performance reporting to develop actionable strategies that enhance resilience, efficiency, and differentiation in a highly competitive industry.