10:45 – 11:30

PANEL (Yield): AI & Smart Automation for Yield Breakthroughs

  • AI-driven predictive maintenance & defect detection
  • Next-gen process control for defect-free output
  • Balancing automation with human oversight

 

Panelist

Lip Wee Ho

VP Advanced Technology

Micron Technology, Inc.

Panelist

Sim Cik Goh

Vice President, Fab Operations

Qualcomm Technologies Inc.

Panelist

STMicroelectronics

Panelist

X-FAB

Panelist

UMC