11:40 – 12:25

PANEL (Yield): AI & Smart Automation for Yield Breakthroughs

  • AI-driven predictive maintenance & defect detection
  • Next-gen process control for defect-free output
  • Balancing automation with human oversight

Moderator

Chun Sheng Tan

Board Member

Malaysia Semiconductor Industry Association (MSIA)

Panelist

Sim Cik Goh

Vice President, Fab Operations

Qualcomm Technologies

Panelist

Lip Wee Ho

Vice President of Advanced Technologies Singapore (ADTS)

Micron Technology

Panelist

Patrick Hirt

VP, Business Development

AP&S International

Panelist

Chor Shu Cheng

Yield Engineering Director

Skyworks Solutions