In semiconductor manufacturing, every detail matters, even a small process drift can mean costly waste or lost yield. Inline chemical monitoring is essential for those who want to push precision further and minimize risk.Paeonia has developed the Novel Mid-IR Spectrometer to provide rapid, real-time chemical analysis (900–3,500 cm⁻¹, ~0.3 s response, ~5 × 5.5 × 6 cm) directly in your process stream.Our talk will show how with new innovative technology, we can improve on key wet-process steps—etching (device dimensions), cleaning (contamination), and electroplating (voids).