Yuanli Sun photo

Yuanli Sun

General Manager, SPEA China
SPEA
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Biography

Yuanli Sun received her M.S. degree in Industrial Management from the Polytechnic of Turin (Italy) in July 2012. She joined SPEA during her last academic year as a semiconductor testing equipment application engineer. She rapidly achieved being responsible for application development projects for IC, Power and MEMs devices,technical expertise that involve data modeling and analysis, C/C++ program languages, also, she participated in the design of extremely accurate measurement modules that are widely used in MEMS wafer testing.

With such a strong and well prepared background, in 2014, Yuanli establishes a wholly owned subsidiary of SPEA in China, where she’s responsible in full for SPEA’s business development and after-sales service in China. Riding the wave of success, Yuanli establishes more offices in Suzhou, Shenzhen, and Chongqing to enhance the popularity and reputation of SPEA in China.

Today, as General Manager of SPEA China, her group has worked directly with SPEA’s customers to develop state-of-the-art technology for testing high volume Power Modules, MEMS test cell, wafer level tester high parallelism solutions.

孙媛丽于20127月获得了意大利都灵理工学院的工业管理硕士学位。她在最后一个学年加入 SPEA,担任半导体测试设备应用工程师,主要负责ICPowerMEMS器件的应用开发项目,她精通数据建模和分析、C/C++语言编程等专业技能,参与设计了广泛应用于MEMS晶圆测试的高精密测量模块。

凭借雄厚的技术背景,她于2014年在中国成立了SPEA的全资子公司,全面负责SPEA在中国的业务发展和售后服务。她抓住风口乘势而上,在苏州、深圳和重庆设立了更多的办事处,持续提升SPEA在国内的知名度和声誉。

如今,作为 SPEA 中国区总经理,她的团队直接与 SPEA 的客户合作,开发最先进的技术用于测试高功率模块、MEMS 测试单元、晶圆级测试仪高并行度解决方案。

Company Profile

SPEA

Established in 1976, SPEA is a world leading company in the field of automatic test equipment for ICs, MEMS, sensors, electronic boards. SPEA serves the big semiconductor IDMs and OSATs with the most cost-effective and high-performance equipment to test automotive, SoCs, analog mixed-signal devices, MEMS sensors and actuators, power and discretes, identification devices, delivering highest measurement capabilities, lowest cost of test and fastest time-to-market. SPEA systems are designed to detect any possible defect in electronic products, so that they won’t fail on the field. High throughput, best detection capability, test techniques designed on the latest technologies requirements, complete configurability. For SPEA customers, testing is not an additional cost, but a tangible competitive advantage.